FAAS, FT-IR and XRD Identification of Natural and Heat Treated Opals Located in Wadla Woreda, North Wello, Ethiopia
Adere Tarekegne Habte *
Department of Chemistry, Woldia University, Woldia, Ethiopia.
Shiferaw Dessie Mekonnen
Department of Chemistry, Woldia University, Woldia, Ethiopia.
Adugna Nigatu Alene
Department of Chemistry, Woldia University, Woldia, Ethiopia.
Gietu Yirga Abate
Department of Chemistry, Woldia University, Woldia, Ethiopia.
*Author to whom correspondence should be addressed.
Abstract
Opals are naturally occurring hydrous silica materials (SiO2*nH2O), and have been largely used in jewelry and as decorative elements in artworks due to their optical properties. In this study, we present some gemological properties, a combined spectroscopic (FAAS, FTIR) and X-ray powder diffraction (XRD) identification of natural and heat treated opals obtained from the main deposits in North Wollo, Ethiopia. The gemological measurements, FTIR and XRD spectra for natural and heat treated samples are nearly identical, FAAS shows clear differences on their color this may be due to the concentration differences of metals. Both of these opals showed spectra and diffraction patterns typical of Opal-CT, with clearly defined patterns and main peaks in the 2θ range of cristobalite and tridymite, called microcrystalline opals.
Keywords: Opal, XRD, FAAS, FT-IR, Opal-CT, microcrystalline.